A sub-constant error-probability low-degree test, and a sub-constant error-probability PCP characterization of NP

Abstract

Article A sub-constant error-probability low-degree test, and a sub-constant error-probability PCP characterization of NP Share on Authors: Ran Raz Weizmann Inst., Israel Weizmann Inst., IsraelView Profile , Shmuel Safra Tel-Aviv University, Israel Tel-Aviv University, IsraelView Profile Authors Info & Claims STOC '97: Proceedings of the twenty-ninth annual ACM symposium on Theory of computingMay 1997 Pages 475–484https://doi.org/10.1145/258533.258641Online:04 May 1997Publication History 490citation1,327DownloadsMetricsTotal Citations490Total Downloads1,327Last 12 Months67Last 6 weeks8 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteGet Access