Particle emission induced by the interaction of highly charged slow Xe-ions with a SiO<sub>2</sub>surface - Concepedia

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Particle emission induced by the interaction of highly charged slow Xe-ions with a SiO<sub>2</sub>surface

12

Citations

3

References

1993

Year

G. Schiwietz, Dieter Schneider, M. W. Clark, B. Skogvall, D. R. DeWitt, J. McDonald

Radiation effects and defects in solids

X-ray SpectroscopyEngineeringPhysicsSurface ScienceApplied PhysicsAtomic PhysicsParticle EmissionIon Beam InstrumentationIon BeamParticle Beam PhysicsIon EmissionSlow Xe-ions

References

	Year	Citations

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