Dielectric Behavior of Cubic and Hexagonal Ices at Low Temperatures

Abstract

Cubic ice Ic and hexagonal ice Ih were prepared in pressurizable dielectric cells at temperatures near − 110°C from the high-pressure ices II and IX. No differences were found between the dielectric properties of Ic and Ih. Freshly prepared samples exhibited longer relaxation times at low temperatures than those commonly found for samples of Ih prepared directly by freezing purified water. These long relaxation times became appreciably shorter with sample aging. These results are attributed to precipitation of impurities from ices II and IX, followed by their gradual reincorporation in the ice I lattice. At temperatures as high as − 50°C the isothermal sequence of transformations I→II→I is capable of producing a substantial degree of purification of ice I in terms of its dielectric relaxation time.