Hysteretic response of chemical vapor deposition graphene field effect transistors on SiC substrates

Abstract

Graphene field effect transistors (GFETs) fabricated by chemical vapor deposition graphene deposited onto SiC substrates exhibit sensitivity to broadband visible light. The hysteretic nature of this GFET type was studied utilizing a new current-voltage measurement technique in conjunction with current-time measurements. This measurement method accounts for hysteretic changes in graphene response and enables transfer measurements that can be attributed to fixed gate voltages. Graphene hysteresis is shown to be consistent with electrochemical p-type doping, and current-time measurements clearly resolve a hole to electron to hole carrier transition in graphene with a single large change in gate voltage.