IEEE Transactions on Instrumentation and Measurement · 1964 · 39 citations · 6 references
Natural SciencesElectrical EngineeringMaterials ScienceElectromagneticsMaterials CharacterizationMicrowave EngineeringDielectric MaterialsDielectric PropertiesDielectricsElectrical CharacterizationMicrowave MaterialsMicrowave MeasurementsCharacterization Of Microwave MaterialsDielectric CharacterizationDielectric Constant MeasurementDielectric MeasurementDielectric PermittivityLoss TangentMicrowave Dielectric PropertiesPermittivity Measurement
Three materials, i.e.,fused silica, glass, and alumina, were selected for comparison based on known or expected homogeneity, isotropy, and stability. Measurements were made by the three Government laboratories (U. K., U. S. A., and Canada), both in the radio-frequency range, using capacitor-type holders either with or without an air gap, and at microwave frequencies, using either cavity-resonance methods or transmission-line impedance methods. The range among the laboratories on the real part of the permittivity is 0.4, 0.8, and 0.2 per cent for the three materials, respectively. The agreement on loss tangent is of the order of 0.0001 in many cases, but larger discrepancies exist. An introductory statistical analysis for systematic differences between laboratories is given.
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Frequency Stabilization of Microwave Oscillators
R. V. Pound · Proceedings of the IRE · 1947 · 63 citations