Clocked comparator for high-speed applications in 65nm technology

Abstract

This paper presents a design for an on-chip high-speed clocked-comparator for high frequency signal digitization. The comparator consists of two stages, amplification and regenerative, comprising a total of 10 MOS transistors. The design is implemented in 65nm CMOS technology. Also, the paper presents a new cost effective technique for measuring the maximum speed of the clocked comparator. The measurement and simulation results show that the proposed design has an average of 31% higher speed and ∼17% less active area than the conventional design.