Monte Carlo Simulation of Yield and Energy Distribution of Secondary Electrons Emitted from Metal Surfaces

Kaoru Ohya Kaoru Ohya, Akio Harada, Jun Kawata, Kenji Nishimura Kenji Nishimura

Japanese Journal of Applied Physics · 1996 · 16 citations · 9 references

Concepts

Abstract

A Monte Carlo simulation of secondary electron emission from Be (atomic number Z =4), Mg ( Z =12), Al ( Z =13), Mo ( Z =42) and W ( Z =74) due to 100 eV–4 keV electron impacts is performed in order to understand the primary energy ( E p ) dependence of the yield and the energy distribution of secondary electrons. The E p -dependence of the secondary electron yield calculated for the metals is characterized in terms of the maximum yield and E p at which it occurs, which are in good ageement with Kollath's empirical formula for E p where the formula can be applied. At high E p (>1 keV), the calculated energy distribution of the secondary electrons, except for Mg which has a low surface potential barrier, approaches the E p -independent theoretical curve derived by Chung and Everhart. At low E p , however, the energy distribution largely depends on E p , in particular for high- Z metal.

References

9