Physical review. B, Condensed matter · 1981 · 25 citations · 15 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsCurve FittingElectrical ConductivityMetalsOhm's LawElectrical Resistance MeasurementResistance Data Fitting
High-precision resistance measurements (rms relative error below 4 \ifmmode\times\else\texttimes\fi{} ${10}^{\ensuremath{-}7}$ per point) for nickel around ${T}_{c}$ are reported. When fitting the singular part of the resistance to the function ${R}_{s}=A{|t|}^{1\ensuremath{-}\ensuremath{\alpha}}(1+D{|t|}^{z})$, we obtain $\ensuremath{\alpha}=\ensuremath{-}0.095$, $\frac{A}{{A}^{\ensuremath{'}}}=\ensuremath{-}1.52$, $z=0.57$, and $\frac{D}{{D}^{\ensuremath{'}}}=\ensuremath{-}0.8$ within the temperature region $1.6\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}3}<|t|<12\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}3}$. The cause of the rounding of experimental data close to ${T}_{c}$ is discussed.
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Critical exponents from field theory
J. C. Le Guillou, Jean Zinn‐Justin · Physical review. B, Condensed matter · 1980 · 1.8K citations
Critical phenomena at low temperature
Guenter Ahlers · Reviews of Modern Physics · 1980 · 118 citations