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Compensation of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>p</mml:mi></mml:math>-Type Doping in ZnSe: The Role of Impurity-Native Defect Complexes
171
Citations
24
References
1995
Year
Materials ScienceMath XmlnsIi-vi SemiconductorEngineeringImpurity-native Defect ComplexesCrystalline DefectsPhysicsIntrinsic ImpurityCondensed Matter PhysicsQuantum MaterialsApplied PhysicsFormation EnergySemiconductor MaterialDefect FormationDefect ToleranceObserved SaturationHole Concentration
We have examined the possibility that the saturation of the hole concentration observed in the $p$-type doping of ZnSe is caused by the formation of complexes between the substitutional acceptors and charged native defects such as Se vacancies and Zn interstitials. We present a simple model of compensation in which the relevant parameters are computed from first principles. A large lattice relaxation associated with the Se vacancy and the corresponding complex lowers their formation energy significantly. However, the large binding energy of the acceptor-Zn-interstitial complex should make it a more efficient compensator. Under typical growth conditions, our model reproduces the experimentally observed saturation of the hole concentration in the ${10}^{18}$ ${\mathrm{cm}}^{\ensuremath{-}3}$ range.
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