Quantitative analysis of weak localization in thin Mg films by magnetoresistance measurements

Abstract

The field dependence of the resistance of thin Mg films ($50<R<200\frac{\ensuremath{\Omega}}{\ensuremath{\square}}$) is measured. The field dependence allows a quantitative analysis of the weak localization. The absolute value of the magnetoconductance agrees well with the theory. The temperature dependence of the inelastic scattering time is determined.