Thermally Stimulated and Photostimulated Luminescence from Long Duration Phosphorescent SrAl[sub 2]O[sub 4]:Eu, Dy Crystals

Abstract

The traps in long duration phosphorescent crystals have been evaluated using thermally stimulated luminescence and photostimulated luminescence (PSL) techniques. Afterglow phosphorescence is not observed at temperatures lower than 150 K. Traps with depths of 0.46, and 0.49 eV are detected by thermally stimulated luminescence techniques. Photostimulated luminescence evaluations reveal that trapped carriers can be released optically using an infrared laser with The trap at detected by the PSL may be correlated with the shallow trap levels at © 2003 The Electrochemical Society. All rights reserved.