<i>In situ</i>diffraction measurement of the polymerization of C₆₀at high temperatures and pressures

Abstract

In situ energy dispersive x-ray measurements were performed on C60 fullerene at pressures of 2.6, 5.7 and 12 GPa and temperatures between 300 and 1100 K. The polymerization process was followed in detail and the dynamics of the phase changes measured. This has enabled us to map the P-T phase diagram and look at the dynamics of the phase transformations.