Concepedia
Applied Surface Science · 2005 · 10 citations · 2 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationMetrologyThin FilmsSurface AnalysisSurface CharacterizationSurface MetrologyFilm ThicknessFilm Thickness MeasurementThin Film Surface Characterization
2
Atomic spectrometry update. X-ray fluorescence spectrometry
Philip J. Potts, Andrew T. Ellis, Peter Kregsamer et al. · Journal of Analytical Atomic Spectrometry · 2004 · 20 citations
Natural Sciences, Archaeology, Chemistry +17
New developments in X-ray fluorescence metrology
L.M. van der Haar, Christian Sommer, M. Stoop · Thin Solid Films · 2003 · 10 citations
Natural Sciences, Chemistry, Analytical Chemistry +13