Concepedia

Direct comparison of ion scattering and secondary ion emission as tools for analysis of metal surfaces

M. Grundner, W. Heiland, E. Taglauer

Applied Physics A · 1974 · 36 citations · 19 references

DOI

Concepts

References

19

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

A. Benninghoven · Surface Science · 1973 · 447 citations

, , +14

Auger Ejection of Electrons from Tungsten by Noble Gas Ions

H. D. Hagstrum · Physical Review · 1954 · 375 citations

, , +6

Analysis of surface composition with low-energy backscattered ions

David P. Smith · Surface Science · 1971 · 338 citations

, , +13

Sputtering of Surfaces by Positive Ion Beams of Low Energy

Richard E. Honig · Journal of Applied Physics · 1958 · 260 citations

, , +15

Analysis of the outermost atomic layer of a surface by low-energy ion scattering

H.H. Brongersmal, P.M. Mu · Surface Science · 1973 · 139 citations

, , +11