Physical Review Letters · 1987 · 104 citations · 6 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMagnetic MaterialsThin FilmsCurie TemperatureFerromagnetismMagnetic Properties Of SolidsMagnetic SusceptibilityMagnetic Thin FilmsThin Film Magnetic PropertiesElectron Mean Free PathFinite-size EffectsFinite-size ScalingMean Free PathScaling EffectsSize EffectsSpin GlassesThin Film Magnetism
Using dc sputtering in an UHV system we have prepared multilayer samples of Cu:Mn-Si with Cu:Mn thicknesses, $L$, between 4 and 500 nm. The temperature of the peak in the dc magnetic susceptibility of these spin-glass samples shifts with $L$ as $\frac{({T}_{g0}\ensuremath{-}{T}_{g})}{{T}_{g0}}\ensuremath{\approx}{L}^{\ensuremath{-}0.75\ifmmode\pm\else\textpm\fi{}0.06}$ over the whole range of sample thickness. These results are discussed in terms of finite-size scaling and the possible effects of the electron mean free path on the effective exchange interaction.
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