Application of OCT to examination of easel paintings

Haïda Liang, Rada Cucu, George Dobre, David A. Jackson, Justin Pedro, Christopher N. Pannell, David Saunders, Adrian Podoleanu

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 32 citations · 6 references

Concepts

Abstract

We present results of applying low coherence interferometry to gallery paintings. Infrared low coherence interferometry is capable of non-destructive examination of paintings in 3D, which shows not only the structure of the varnish layer but also the paint layers.

References

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