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Development and characterization of wheat- Leymus racemosus translocation lines with resistance to Fusarium Head Blight

DOI

84

Citations

10

References

2005

Year

Peidu Chen, Wenxuan Liu, Jianhua Yuan, Xiue Wang, Bo Zhou, Suling Wang, Shouzhong Zhang, Yigao Feng, Baojun Yang, Guangxin Liu,
Theoretical and Applied Genetics

References

YearCitations

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