Effects of electrical and temperature stress on polysilicon resistors for CMOS technology applications - Concepedia

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Effects of electrical and temperature stress on polysilicon resistors for CMOS technology applications

13

Citations

5

References

2002

Year

Kong-Beng Thei, Hung-Ming Chuang, Sheng‐Fu Tsai, Chun-Tsen Lu, Xin-Da Liao, Kuan‐Ming Lee, Wen-Chau Liu

Superlattices and Microstructures

Electrical EngineeringEngineeringResistorStress-induced Leakage CurrentTemperature StressBias Temperature InstabilityPolysilicon ResistorsCmos Technology ApplicationsElectronic PackagingSilicon On InsulatorMicroelectronicsElectrical Insulation

References

	Year	Citations

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