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Metrological characterization of X-ray diffraction methods for determination of crystallite size in nano-scale materials

Materials ScienceEngineeringNanomaterialsCrystal Growth TechnologyMaterials CharacterizationApplied PhysicsX-ray DiffractionX-ray Diffraction MethodsMetrological CharacterizationCrystal FormationNanocrystalline MaterialCrystallographyMicrostructureCrystallite Size