Applied Optics · 1980 · 152 citations · 23 references
EngineeringElectrical EngineeringPhysicsOpticsOptoelectronicsPhotonicsElectro-optic EffectsOptical InstrumentsOptical SensingPhysical OpticsPolarization OpticsAccuracyNew Instrument DesignPolarimetric Instrument DesignPolarimetric MetrologyPolarimetryPolarization Interferometry
A new instrument for rapid and accurate measurement of the Mueller matrix is described. Distinct measurements of all sixteen elements are made simultaneously and with an absolute accuracy of 1-5%. The instrument employs electrooptic modulators. Results are presented for several simple optical devices and systems.
23
Light Scattering by a Spheroidal Particle
Shoji Asano, Giichi Yamamoto · Applied Optics · 1975 · 726 citations
High Precision Scanning Ellipsometer
D. E. Aspnes, A. A. Studna · Applied Optics · 1975 · 644 citations