Publication | Closed Access
Improved subthreshold characteristics in tunnel field-effect transistors using shallow junction technologies
14
Citations
6
References
2012
Year
Device ModelingElectrical EngineeringEngineeringTunneling MicroscopyNanoelectronicsBias Temperature InstabilitySubthreshold CharacteristicsApplied PhysicsTunnelingTunnel Field-effect TransistorsShallow Junction TechnologiesMicroelectronicsSemiconductor Device
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