Applied Physics Letters · 1996 · 24 citations · 0 references
Natural SciencesMaterials EngineeringMaterials ScienceMagnetic MaterialsNanomaterialsSurface ScienceExchange Bias MaterialsFerromagnetic MaterialsFerromagnetismMagnetic OxidesMagnetic Properties Of SolidsMagnetism In SolidsFerromagnetic OrderingMagnetic HeterostructuresMagnetic ScatteringMolecular Beam EpitaxyNeutron ReflectionNeutron ReflectometryPolarized Neutron ScatteringThin-film Multiferroics
Polarized neutron reflectometry was performed on a [Fe3O4/NiO]x15 multilayer, molecular beam epitaxy grown on a (001) MgO substrate, in both exchange biased and nonexchange biased states. The Fe3O4 layers exhibit a depth-dependent magnetic profile characterized by a change in the magnetization near the Fe3O4/NiO interfaces. In the exchange biased state, measurements performed in the two saturated states of the magnetic hysteresis loop reveal magnetic differences in the Fe3O4, possibly due to the interfacial domain wall formation in the ferromagnetic layer.