Applied Physics Letters · 1995 · 27 citations · 0 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsOptical MaterialsSemiconductor MaterialsCrystal GrowthElectron DiffractionElectron MicroscopyEpitaxial GrowthOptical Properties Of SemiconductorsTransmission Electron MicroscopyCrystalline StructureEpitaxial Film GrowthEpitaxial MaterialsMolecular Beam EpitaxyOptical PropertiesPhotoluminescenceReflection High-energy Electron DiffractionSubstrate Pre-treatment
High quality, lattice matched Zn1−xCdxSe has been grown on InP substrates by molecular beam epitaxy. The quality of the epilayers was monitored by reflection high energy electron diffraction, and by low temperature photoluminescence and transmission electron microscopy (TEM). The use of an As flux during the pregrowth substrate treatment followed by a low initial growth temperature were needed to optimize the growth. TEM images of samples grown under these conditions show abrupt interfaces and good crystalline quality. Epilayers exhibit excellent optical properties, indicated by a very narrow, high intensity near-band-edge excitonic emission peak (full width at half maximum of 10 meV), and almost negligible deep level emission.