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A Surface Conductivity Approach to the Measurement of Adsorption at Metal-Solution Interfaces
20
Citations
12
References
1969
Year
Materials ScienceElectrical ConductionSurface CharacterizationSolid-state IonicEngineeringInterface ChemistrySurface ScienceApplied PhysicsMaterials CharacterizationIonic AdsorptionChemisorptionPotential Scan TechniquesThin Film Process TechnologyAdsorptionThin FilmsMetal-solution InterfacesThin Film ProcessingSurface Conductivity Approach
SUMMARY Changes in electrical conduction of thin (∼ 100 Å) films of Pt sputtered onto glass are shown to give very rough (±100%) measurements of ionic adsorption. The method is applicable under circumstances which preclude the applicability of radiotracer or potential scan techniques.
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