Diamond anvil device for x-ray diffraction on single crystals under pressures up to 100 kilobar

Abstract

A new high-pressure diamond anvil device is described which allows for x-ray diffraction intensity measurements on single crystals up to hydrostatic pressures of about 100 kilobar. The present device fits into commercial x-ray diffractometers such as precession cameras and four-circle diffractometers. The pressure is determined by measuring the ruby R1-line shift with a Fabry–Pérot interferometer which is coupled to a microscope system. First measurements on Se carried out on a precession camera indicate that atomic position parameters and pressures can be determined with standard deviations of ±0.002 and ±0.7 kilobar.