Zeitschrift für Naturforschung A · 1968 · 14 citations · 0 references
Natural SciencesChemistryMaterials ScienceAnalytical ChemistryMass Spectrometric AnalysisMetallurgyAnalytical MeasurementsElemental Composition AnalysisInstrumental AnalysisIonization ProcessesMass AnalyzersMass SpectrometryAluminium AlloysIron-based AlloysSecondary Ion Mass Spectrometry
An alloy bombarded with 12 keV — Ar + -ions emits singly charged secondary ions (SI) of all components of the target. By measuring the SI-currents in a mass spectrometer a quantitative analysis is possible (Ion-bombardment ion source). The SI-emission of aluminium and iron alloys with varying concentration of other components is investigated. It is shown that the relative SI yield, i. e., the ratio of the SI yield of the extra components to the yield of the main components aluminium and iron, respectively is independent of the composition of the sample provided that the sample contains more than 90% of the main component. This result is in qualitative agreement with the Langmuir-Saha-equation.