X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene

Abstract

The structure of the thin film phase of pentacene was investigated using x-ray diffraction reciprocal space mapping (RSM). The crystal structure was found to be triclinic with the following lattice parameters: a=0.593nm, b=0.756nm, c=1.565nm, α=98.6°, β=93.3°, and γ=89.8°. Atomic positions were determined by comparing the observed RSM diffraction intensities with theoretical calculations.