Concepedia

Performance of 12-μm- to 15-μm-Pitch MWIR and LWIR HgCdTe FPAs at Elevated Temperatures

R. L. Strong, M. A. Kinch, John M. Armstrong

Journal of Electronic Materials · 2013 · 29 citations · 3 references

Concepts

EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesElectromagnetic CompatibilityHigh-frequency Semiconductor DevicesHigh-temperature MaterialsMicrowave Integrated CircuitsMicrowave Semiconductor DevicesWide Band Gap SemiconductorsHigh-frequency ElectronicsHigh-temperature Device OperationHigh-temperature ElectronicsHigh-temperature TestingMaterial Behaviour At Elevated TemperaturesTemperature Dependence Measurement

References

3

Semiconductor surface physics

C. Hilsum · Journal of Physics and Chemistry of Solids · 1958 · 616 citations

Summary of HgCdTe 2D array technology in the U.K.

Ian Baker, C. D. Maxey · Journal of Electronic Materials · 2001 · 80 citations

Engineering, Materials Engineering, Materials Science +14

Universal 1/f noise model for reverse biased diodes

M. A. Kinch, Chang-Feng Wan, H. F. Schaake et al. · Applied Physics Letters · 2009 · 24 citations

Engineering, Electrical Engineering, Electronic Materials +16