Review of Scientific Instruments · 1985 · 51 citations · 4 references
Natural SciencesMaterials SciencePhysicsMagnetic MaterialsOptical MaterialsOpticsMagnetic CharacterizationMagnetic Thin FilmsMagnetism In SolidsPolarization OpticsThin Film Magnetic PropertiesThin Film Optical PropertiesEllipsometryHysteresis LoopsMagneto-optic Kerr EffectMagneto-optical Kerr EffectMagneto-optical PropertiesOptical ConstantsOptical Kerr EffectPolarization Modulation
A magneto-optical ellipsometer is described which uses polarization modulation and the longitudinal magneto-optical Kerr effect. The ellipsometer allows a full determination of the optical and magneto-optical constants of magnetic materials, as well as the registration of in-plane hysteresis loops. The latter application is illustrated on a Ni80Fe20 thin-film sample.
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<i>Ellipsometry and Polarized Light</i>
R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations
Natural Sciences, Physics, Optics +13