IET Science Measurement & Technology · 2008 · 19 citations · 10 references
EngineeringElectrical EngineeringComputational ElectromagneticsElectromagneticsMicroelectronicsElectromagnetic CompatibilityElectromagnetic Compatibility TestingElectromagnetic MethodsMicrowave MeasurementsNear-field RegionsSpectral AnalysisElectromagnetic Compatibility MeasurementField MeasurementsMicrowave DevicesPost-processingRadiated Emissions
International audience
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