Publication | Closed Access
Effect of Bismuth on Intermetallic Compound Growth in Lead Free Solder/Cu Microelectronic Interconnect
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Citations
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References
2011
Year
Materials ScienceElectrical EngineeringWafer Scale ProcessingEngineeringApplied PhysicsMetallurgical InteractionElectronic PackagingMicroelectronicsIntermetallic Compound GrowthInterconnect (Integrated Circuits)
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