Publication | Closed Access
Metastable GaAsBi Alloy Grown by Molecular Beam Epitaxy
133
Citations
6
References
2003
Year
Materials ScienceSemiconductorsMaterials EngineeringGabi Molar FractionEngineeringCrystalline DefectsCrystal Growth TechnologyApplied PhysicsMolecular Beam EpitaxyEpitaxial GrowthCompound SemiconductorBi Incorporation
GaAs1-xBix has been grown at a substrate temperature (Tsub) between 350 and 410°C by molecular beam epitaxy. The relationship between GaBi molar fraction (x) evaluated by Rutherford backscattering spectroscopy and the lattice constant showed good linearity. To achieve Bi incorporation into the epilayer, As flux was adjusted in a limited range on the brink of As shortage on the growing surface. The Bi incorporation was saturated at a large Bi flux, probably due to a low miscibility of Bi with GaAs. The value of x increased up to 4.5% with decreasing Tsub to 350°C.
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