Publication | Closed Access

Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devices

PhotonicsElectrical EngineeringEngineeringHigh-frequency DeviceElectronic EngineeringApplied PhysicsLarge-signal CharacterizationInstrumentationMicroelectronicsElectro-optics DeviceOptoelectronicsElectromagnetic CompatibilityElectronic Circuit