Publication | Closed Access
PHOTOEMISSION FROM InP-Cs-O
39
Citations
5
References
1968
Year
Inp BandgapPhotoelectric MeasurementsElectrical EngineeringElectronic DevicesEngineeringPhotoelectric SensorPhotochemistryApplied PhysicsComputer EngineeringWork FunctionPhotoelectric MeasurementCharge ExtractionOptoelectronicsPhotoelectrochemistry
Photoelectric measurements on cleaved p+ InP show that a process of cesiation and oxidation can produce a work function lower than the InP bandgap. Efficient photoemission results, with luminous efficiencies of 450 μA/lumen or better, and a threshold at 1.24 eV (1 μ).
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