Saturated and near-diffraction-limited operation of an XUV laser at 23.6 nm

A. Carillon, H. Z. Chen, P. Dhez, L. Dwivedi, J. Jacoby, P. Jaeglé, G. Jamelot, Jie Zhang, M. H. Key, A. Kidd,

Physical Review Letters · 1992 · 159 citations · 13 references

Concepts

Abstract

Amplification of spontaneous emission (ASE) at 23.6 nm has been studied in a Ge plasma heated by a 1 TW infrared laser pulse. The exponent of the axial gain reached 21 in a geometry with Fresnel number \ensuremath{\le}1. Two plasma columns of combined length up to 36 mm were used with an extreme ultraviolet mirror giving double-pass amplification. Saturation of the ASE output was observed. The beam divergence was about 8\ifmmode\times\else\texttimes\fi{} diffraction limited with a brightness estimated at ${10}^{14}$ W ${\mathrm{cm}}^{\mathrm{\ensuremath{-}}2}$ ${\mathrm{sr}}^{\mathrm{\ensuremath{-}}1}$. The feedback from the mirror was significantly reduced probably by radiation damage from the plasma.

References

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