IEEE Journal of Quantum Electronics · 2005 · 40 citations · 39 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesDevice CharacterizationLaser DiodesLaser PhysicsOptical Properties Of SemiconductorsSemiconductor Device MaterialsSemiconductor LasersBeam DivergenceLaser Beam QualityOptical GainReflectivitySemiconductor Laser DiodesSingle-mode OperationSingle-mode Semiconductor Lasers
An accurate laser simulator is developed to investigate the influences of various device parameters on modal discrimination and beam quality to optimize the brightness of semiconductor lasers. Previous work using the Prony method is extended, both by using a more robust laser simulator to solve for the optical fields and by extending the Prony method to operating conditions above threshold. The semiconductor laser model is used to investigate the effects of various device parameters on the characteristics of a gain-guided 980-nm Al-free stripe geometry laser. The device parameters investigated are the device geometry, the thickness and doping level of the waveguiding layer and the front facet reflectivity. Together with practical and economic considerations, the device parameters of a wide emitter gain-guided laser are optimized. The optimized gain-guided laser is predicted to operate in the fundamental mode up to 1.15 W. At this maximum fundamental mode power, the slow axis beam divergence at 1/e/sup 2/ points is 5.4/spl deg/, the beam quality factor M/sup 2/ is 1.62, the astigmatism is 27 /spl mu/m, and the brightness is 61 MW/cm/sup 2/sr.
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H. C. Casey, M. B. Panish, T. A. Roth · Journal of The Electrochemical Society · 1979 · 1.7K citations
Diode Lasers and Photonic Integrated Circuits
L.A. Coldren · Optical Engineering · 1997 · 1.7K citations
Resonant Modes in a Maser Interferometer
A. G. Fox, Tingye Li · Bell System Technical Journal · 1961 · 1.5K citations
Natural Sciences, Physics, Optics +16
Physics of Semiconductor Laser Devices
J.E. Carroll · IEE Proceedings I Solid State and Electron Devices · 1981 · 289 citations