Publication | Open Access
Electrical characterization of as-grown, annealed and indium-doped Hg1-xZnxTe for x near 0.15
18
Citations
20
References
1989
Year
Materials ScienceSemiconductor TechnologyElectrical EngineeringIi-vi SemiconductorNot.the DocumentsEngineeringApplied PhysicsQuantum MaterialsCondensed Matter PhysicsElectrical CharacterizationEnergy StorageIndium-doped Hg1-xznxteScientific Research DocumentsSemiconductor MaterialHydrogenChemistryCrystallographyElectrochemistry
HAL is a multi-disciplinary open access archive for the deposit and dissemination of scientific research documents, whether they are published or not.The documents may come from teaching and research institutions in France or abroad, or from public or private research centers.L'archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d'enseignement et de recherche français ou étrangers, des laboratoires publics ou privés. Electrical characterization of as-grown, annealed andindium-doped Hg1-xZnxTe for x near 0.15
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