Publication | Closed Access
A high resolution XPS study of a complex insulator: the case of porous silicon
23
Citations
12
References
1997
Year
EngineeringPhysicsSilicon DebuggingIntrinsic ImpurityCondensed Matter PhysicsApplied PhysicsSemiconductor MaterialSemiconductor Device FabricationComplex InsulatorElectronic PackagingSilicon On InsulatorMicroelectronicsPorous SiliconElectrical Insulation
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