Critical Reviews in Analytical Chemistry · 2003 · 45 citations · 0 references
Natural SciencesChemistryAnalytical ChemistryElemental AnalysisMass Spectrometric AnalysisAtomic SpectroscopyHeavy Metal AnalysisInstrumental AnalysisMass Spectrometric Elemental AnalysisMass SpectrometryTrace Element AnalysisInductively Coupled Plasma AnalysisInductively Coupled Plasma SpectrometryMultielement AnalysisMultielement DeterminationSolid Sampling Mass SpectrometryTrace Metal AnalysisTrace Metal DetectionTrace Metal Determination
Solid Sampling-Electrothermal Vaporization-Inductively Coupled Plasma-Mass Spectrometry (SS-ETV-ICP-MS) is an attractive technique for the direct simultaneous determination of trace metals in solid samples. During recent years, some important developments dealing with ETV-ICP coupling and with analyte transport efficiencies have been reported, and so SS-ETV-ICP-MS has received a renewed interest by the atomic spectroscopy community. Thus, the present review highlights the inherent capabilities of SS-ETV-ICP-MS for the simultaneous determination of trace metals. In addition, technical aspects of ETV-ICP coupling as well as more recent applications are reported. It is concluded that this technique is a powerful tool for sorting out some of the current analytical challenges, and future advances are to be expected in order to widen the field of application.