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Observation of single-electron-tunneling oscillations
71
Citations
27
References
1990
Year
Categoryquantum ElectronicsEngineeringSingle-electron-tunneling OscillationsSemiconductor DevicePhase LockingRf SemiconductorTunneling MicroscopyElectron SpectroscopyElectronic EngineeringSuperconductivityQuantum MaterialsPeriodic TunnelingQuantum ScienceElectrical EngineeringPhysicsMicroelectronicsTime CorrelationApplied PhysicsCondensed Matter Physics
The time correlation of tunneling events has been predicted to occur in ultrasmall tunnel junctions: a periodic tunneling with a frequency determined by the current f=I/e. To test the predictions, we have fabricated one-dimensional arrays of Al/${\mathrm{Al}}_{\mathit{x}}$${\mathrm{O}}_{\mathit{y}}$/Al tunnel junctions with areas down to 0.006 \ensuremath{\mu}${\mathrm{m}}^{2}$ corresponding to capacitances of \ensuremath{\sim}0.2 fF. Each array contained between 15 and 53 junctions. Current-voltage characteristics were measured at temperatures between 0.05 and 4.2 K. We observed phase locking of single-electron-tunneling oscillations to external microwaves in the frequency range 0.7--5 GHz. The phase locking manifested itself as peaks in the differential resistance at bias currents I=nef (n=\ifmmode\pm\else\textpm\fi{}1,\ifmmode\pm\else\textpm\fi{}2), corresponding to multiples of the microwave frequency. Numerical simulations show good agreement with our experimental results.
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