Publication | Closed Access
Theory of Threading Edge and Screw Dislocations in GaN
328
Citations
19
References
1997
Year
Materials EngineeringMaterials ScienceWide-bandgap SemiconductorEdge DislocationsEngineeringPhysicsLine EnergiesDislocation InteractionApplied PhysicsAluminum Gallium NitrideThreading EdgeGan Power DeviceSolid MechanicsCategoryiii-v SemiconductorBand Gap
The atomic structures, electrical properties, and line energies for threading screw and threading edge dislocations of wurtzite GaN are calculated within the local-density approximation. Both dislocations are electrically inactive with a band gap free from deep levels. These results are understood to arise from relaxed core structures which are similar to ( $10\overline{1}0$) surfaces.
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