Field-dependent linewidths and photoluminescence energies in GaAs-AlGaAs multiquantum well modulators

Abstract

Photoluminescence linewidths and transition energies have been measured in GaAs-AlGaAs multiple quantum wells with large (≥160 Å) barrier widths as a function of applied transverse electric field. The experimental data agree well with values calculated by using a recently developed variational technique. It is apparent that heterointerface roughness is the dominant line broadening mechanism. The emission intensity decreases rapidly with field, principally due to carrier tunneling at high fields. At 80 kV/cm a shift of 20 meV in the emission energy is observed.