Laser operation of a heterojunction bipolar light-emitting transistor

Abstract

Data are presented demonstrating the laser operation (quasicontinuous, ∼200K) of an InGaP–GaAs–InGaAs heterojunction bipolar light-emitting transistor with AlGaAs confining layers and an InGaAs recombination quantum well incorporated in the p-type base region. Besides the usual spectral narrowing and mode development occurring at laser threshold, the transistor current gain β=ΔIc∕ΔIb in common emitter operation decreases sharply at laser threshold (6.5→2.5,β>1).