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Integrated circuit metal in the charged device model: bootstrap heating, melt damage, and scaling laws

Device ModelingElectrical EngineeringElectromigration TechniqueEngineeringCharged Device ModelApplied PhysicsMetallurgical InteractionThermodynamicsThermal ConductionElectronic PackagingHeat TransferMicroelectronicsElectrical PropertyBootstrap HeatingElectrical InsulationMelt Damage