Publication | Closed Access
Room temperature fabricated transparent amorphous indium zinc oxide based thin film transistor using high-κ HfO2 as gate insulator
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Citations
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References
2011
Year
Materials ScienceRoom TemperatureElectrical EngineeringThin Film TransistorEngineeringOxide ElectronicsOxide SemiconductorsApplied PhysicsGate InsulatorSemiconductor MaterialThin Film Process TechnologyThin FilmsThin Film ProcessingSemiconductor Device
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