Journal of the Optical Society of America · 1950 · 15 citations · 2 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsThin FilmsOptical Thin FilmsRefractive IndexThin Film Optical PropertiesThin-film MaterialsFilm ThicknessFilm Thickness MeasurementIndex Of Refraction MeasurementOptical Thickness MeasurementRefractive Index DeterminationRefractive Index EstimationRefractive Index MeasurementThin-film Refractive Index
Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text P. D. Fochs, "A Method of Determining Concurrently the Thickness and Refractive Index of a Thin Film or Lamina," J. Opt. Soc. Am. 40, 623-623 (1950) Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article
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