Investigations of the structure of amorphous and partially crystalline metallic alloys by high resolution electron microscopy

Abstract

SUMMARY A number of amorphous and partially crystalline palladium‐silicon alloys have been examined by high resolution transmission electron microscopy at 500 kV. With the directly interpretable resolution extending beyond the first peak in the structure factor at 0ṁ23 nm, details of the local microstructure at the atomic level are visible. Images of small metallic particles show a well‐defined pattern of fringes over local regions. In some instances, especially in partially‐ordered alloys, neighbouring or overlapping fringe patterns appear to be orientationally‐related in a similar manner to fringe systems seen in symmetrically multiply‐twinned particles. The significance of this type of structural examination for amorphous metals is discussed.