Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering - Concepedia

Concepedia

Publication | Closed Access

Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering

49

Citations

22

References

2008

Year

P. Kluth, Claudia S. Schnohr, David Sprouster, A.P. Byrne, David Cookson, M. C. Ridgway

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Materials ScienceAmorphous Sio2Material AnalysisEngineeringOxide ElectronicsLatent TracksSurface ScienceApplied PhysicsAmorphous SolidSilicon On Insulator

References

	Year	Citations

Page 1