Structural study of amorphous In2O3 film by grazing incidence X-ray scattering (GIXS) with synchrotron radiation - Concepedia

Concepedia

Publication | Closed Access

Structural study of amorphous In2O3 film by grazing incidence X-ray scattering (GIXS) with synchrotron radiation

44

Citations

12

References

2005

Year

Futoshi Utsuno, Hiroyuki Inoue, Itaru Yasui, Yukio Shimane, Shigekazu Tomai, Shigeo Matsuzaki, Kazuyoshi Inoue, Ichiro Hirosawa, Masugu Sato, Tetsuo Honma

Thin Solid Films

Materials ScienceEngineeringIncidence X-ray ScatteringX-ray DiffractionApplied PhysicsAmorphous In2o3 FilmAmorphous SolidSynchrotron RadiationCrystallographySynchrotron Radiation Source

References

	Year	Citations

Page 1

Page 1