The probing depth of total electron yield in the sub-keV range: TEY-XAS and X-PEEM - Concepedia

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The probing depth of total electron yield in the sub-keV range: TEY-XAS and X-PEEM

245

Citations

22

References

2003

Year

B. H. Frazer, Benjamin Gilbert, Brandon R. Sonderegger, Gelsomina De Stasió

Surface Science

X-ray SpectroscopyEngineeringPhysicsSub-kev RangeElectron SpectroscopyApplied PhysicsCondensed Matter PhysicsAtomic PhysicsTotal Electron YieldElectron Optic

References

	Year	Citations

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